Nakamori Yasuhiko | High-Technology Research Center, Kansai University
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概要
High-Technology Research Center, Kansai University | 論文
- Theory of carrier-density-fluctuation-induced transport noise in metal-oxide-semiconductor field-effect transistors
- Semi-classical consideration of velocity overshoot effect on transport noise in short-channel MOSFETs
- Impact of transport noise enhancement in scaled-down MOSFET