Nakazawa Kenji | NTT Applied Electronics Laboratories
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概要
NTT Applied Electronics Laboratories | 論文
- Two-Dimensional Weak Localization in Electron High-T_c Superconductor Nd(2-x) Ce_xCuO_y under High Magnetic Field
- Ultrasonic Measurement on the Single Crystal La_Sr_CuO_4 : Physical Acoustics
- Ion-Implanted Diamond Tip for a Scanning Tunneling Microscope
- Generation of Misfit Dislocations in Si_Ge_x/Si Heterostructures
- Dislocation Reduction in MBE-Grown Ge on Si (001) by in situ Thermal Annealing : Condensed Matter