KOHLER K. | Fraunhofer Institut fur Angewandte Festkorperphysik
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概要
Fraunhofer Institut fur Angewandte Festkorperphysik | 論文
- Fabrication of High Breakdown Pseudomorphic Modulation Doped Field Effect Transistors Using Double Dry Etched Gate Recess Technology in Combination with E-Beam T-Gate Lithography
- E-Beam Ditrct-Write in a Dry-Etched Recess Gate HEMT Process for GaAs/AlGaAs Circuits : Microfabrication and Physics
- E-Beam Direct-Write in a Dry-Etched Recess Gate HEMT Process for GaAs/AlGaAs Circuits