Shih Po-Sheng | Institute of Electronics, National Chiao Tung University, Taiwan, R.O.C.

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• Institute of Electronics, National Chiao Tung University, Taiwan, R.O.C.の論文著者

Institute of Electronics, National Chiao Tung University, Taiwan, R.O.C. | 論文

• Characterization and Reliability of Lightly-Doped-Drain Polysilicon Thin-Film Transistors with Oxide Sidewall Spacer Formed by One-Step Selective Liquid Phase Deposition
• A Novel SiGe Raised Source/Drain Polycrystalline Silicon Thin-Film Transistor with Improved On-Current and Larger Breakdown Voltage

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