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TSAI Yan-Ying | 論文著者
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Tsai Yan-ying
Institute Of Microelectronics Department Of Electrical Engineering National Cheng-kung University
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TSAI Yan-Ying
Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University
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Tsai Yan-Ying
Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, 1 University Road, Tainan, Taiwan 70101, Republic of China
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Tsai Yan-Ying
Institute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, No. 1 University Road, Tainan, Taiwan 70101, Republic of China