OURA Kenjiro | 論文著者

Department of Electronic Engineering, Graduate School of Engineering, Osaka University|Research Center for Ultrahigh Voltage Electron Microscopy, Osaka University

Department of Electronic Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan

Department of Information Systems Engineering, Faculty of Engineering, Osaka University

Dept. Of Electoronics Engineering Faculty Of Engineering Osaka University

Dept. of Electoronics Engineering,faculty of Engineering,Osaka University

Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osak

Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University

Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan

Division of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University|Research Center for Ultrahigh Voltage Electron Microscopy, Osaka University

Electron Beam Laboratory Faculty Of Engineering Osaka University

Electron Beam Laboratory Fuculty Of Engineering Osaka University

Electron Beam Laboratory, Faculty of Engineering, Osaka University

Electron Beam Laboratory, Faculty of Engineering, Osaka University, Suita, Osaka 565

Electron Beam Laboratory, Faculty of Engineering, Osaka University, Yamada-Oka, Suita, Osaka 565

Electron Beam Laboratory, Fuculty of Engineering, Osaka University

Electron Engineering, Faculty of Engineering, Osaka University

Faculty Of Engineering Osaka University

Faculty Of Engineering Osaka Univetsity

Faculty of Engineering, Osaka University

Faculty of Engineering, Osaka Univetsity