Resistivity Measurement by Dual-Configuration Four-Probe Method

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概要

• 論文の詳細を見る
• Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
• 2003-02-15

著者

• YAMASHITA Masato

  Toyama University

• Mizutani Hiroya

  Dia Instruments Co. Ltd.

• NISHII Toshifumi

  Dia Instruments Co. Ltd.

関連論文

• Resistivity Correction Factor for the Four-Point Probe Method on Cylindrical Materials
• Resistivity Measurement by Dual-Configuration Four-Probe Method
• Resistivity Measurement by Dual-Configuration Four-Probe Method

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