Resistivity Measurement by Dual-Configuration Four-Probe Method
スポンサーリンク
概要
- 論文の詳細を見る
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 2003-02-15
著者
-
YAMASHITA Masato
Toyama University
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Mizutani Hiroya
Dia Instruments Co. Ltd.
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NISHII Toshifumi
Dia Instruments Co. Ltd.
関連論文
- Resistivity Correction Factor for the Four-Point Probe Method on Cylindrical Materials
- Resistivity Measurement by Dual-Configuration Four-Probe Method
- Resistivity Measurement by Dual-Configuration Four-Probe Method