Design of Shallow Acceptors in GaN through Zinc--Magnium Codoping: First-Principles Calculation
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概要
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In this work, we propose a novel approach to reduce the ionization energy of acceptors in GaN through Zn--Mg codoping. The characteristics of the defect states and the valence-band maximum (VBM) were investigated via first-principles calculation. Our results indicated that the original VBM of the host GaN could be altered by Zn--Mg codoping, thus improving the p-type dopability. We show that the calculated ionization energy \varepsilon (0/-) of the Zn--Mg acceptor is only 117 meV, which is about 90 meV shallower than that of the isolated Mg acceptor.
- 2013-04-25
著者
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Lu Na
Department of Engineering Technology, The University of North Carolina at Charlotte, 9201 University City Blvd., Charlotte, NC 28223, U.S.A.
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Liu Zhiqiang
R&D Center for Semiconductor Lighting, Chinese Academy of Sciences, Beijing 100083, P. R. China
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Melton Andrew
Department of Electrical and Computer Engineering, The University of North Carolina at Charlotte, 9201 University City Blvd., Charlotte, NC 28223, U.S.A.
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Yi Xiaoyan
R&D Center for Semiconductor Lighting, Chinese Academy of Sciences, Beijing 100083, P. R. China
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Kucukgok Bahadir
Department of Electrical and Computer Engineering, The University of North Carolina at Charlotte, 9201 University City Blvd., Charlotte, NC 28223, U.S.A.
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Kang Jun
National Lab for Superlattices and Microstructure, Chinese Academy of Sciences, Beijing 100083, P. R. China
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Wang Junxi
R&D Center for Semiconductor Lighting, Chinese Academy of Sciences, Beijing 100083, P. R. China
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Li Jinmin
R&D Center for Semiconductor Lighting, Chinese Academy of Sciences, Beijing 100083, P. R. China
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Ferguson Ian
Department of Electrical and Computer Engineering, The University of North Carolina at Charlotte, 9201 University City Blvd., Charlotte, NC 28223, U.S.A.
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Wang Jianwei
Department of Electrical and Computer Engineering, The University of North Carolina at Charlotte, 9201 University City Blvd., Charlotte, NC 28223, U.S.A.
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LU Na
Department of Engineering Technology, The University of North Carolina at Charlotte
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WANG Jianwei
Department of Electrical and Computer Engineering, The University of North Carolina at Charlotte
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