Surface potential measurement of tris(8-hydroxyquinolinato)aluminum and bis〔N-(1-naphthyl)-N-phenyl〕benzidine thin films fabricated on indium-tin oxide by Kelvin probe force microscopy
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- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics | 論文
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