Carbon Multiprobe on a Si Cantilever for Pseudo-Metal-Oxide-Semiconductor Field-Effect-Transistor (Special Issue: Scanning Tunneling Microscopy/Spectroscopy and Related Techniques)
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- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics | 論文
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