Simulation of secondary electron emission from a stepped surface in scanning ion microscopes

スポンサーリンク

概要

• 論文の詳細を見る
• Institute of Physicsの論文
• 2014-05-08

著者

• Ohya Kaoru

  Institute Of Technology And Science The University Of Tokushima

• Ohya Kaoru

  Institute of Technology and Science, The University of Tokushima, Tokushima 770-8506, Japan.

関連論文

• Hydrocarbon Redeposition on Plasma Facing Walls Intersecting Magnetic Field at Shallow Angles
• Calculation of D/XB Values of Hydrocarbon Molecules in Tokamak Edge Plasmas
• Simulation study on image contrast and spatial resolution in helium ion microscope
• Monte Carlo Simulation of Hydrocarbon Redeposition on a Graphite Surface in Hydrogen Plasma
• Redeposition Characteristics of Heavy Hydrocarbon Molecules on a Divertor Plate
• Simulation of secondary electron emission from a stepped surface in scanning ion microscopes

スポンサーリンク