Linear Electro-Optic Effect in Electroreflectance Spectra of AlGaN/InGaN/GaN Light Emitting Diodes Structures
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概要
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The linear electro-optic effect in InGaN/AlGaN/GaN pn-heterostructures for light emitting diodes, grown by metal--organic chemical vapor deposition on sapphire substrates and flip-chip mounted, was studied by electroreflectance spectroscopy. Interference fringes, whose parameters depend on the DC voltage applied on the pn-junction, were observed in electroreflectance spectra. Data analysis, based on a calculation of the built-in electric field in the depletion layer and linear electro-optic effect, yielded the linear electro-optic coefficient r_{13} of 22\pm 6 pm/V for hexagonal In<inf>0.12</inf>Ga<inf>0.88</inf>N.
- 2013-08-25
著者
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Bokov Pavel
Physics Department, M.V. Lomonosov Moscow State University, Leninskie Gory, 119991, Russia
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Avakyants Lev
Physics Department, M.V. Lomonosov Moscow State University, Leninskie Gory, 119991, Russia
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Aslanyan Artem
Physics Department, M.V. Lomonosov Moscow State University, Leninskie Gory, 119991, Russia
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Chervyakov Anatoly
Physics Department, M.V. Lomonosov Moscow State University, Leninskie Gory, 119991, Russia
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Polozhentsev Kirill
Physics Department, M.V. Lomonosov Moscow State University, Leninskie Gory, 119991, Russia
関連論文
- Linear Electro-Optic Effect in Electroreflectance Spectra of AlGaN/InGaN/GaN Light Emitting Diodes Structures
- Linear Electro-Optic Effect in Electroreflectance Spectra of AlGaN/InGaN/GaN Light Emitting Diodes Structures (Special Issue : Recent Advances in Nitride Semiconductors)