Scanning Kelvin Probe Investigations of TiO

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概要

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• This work presents a scanning Kelvin probe microscopy (SKPM) study of poly(3-hexylthiophene) (P3HT):TiO<inf>2</inf>nanoparticle hybrid layers under dark and light conditions. This method gives information on the topography and local work function at the nanometer scale. TiO<inf>2</inf>nanoparticles prepared by the chemical method are dispersed in P3HT organic matrix in the form of agglomerates as revealed by topography and field emission scanning electron microscopy (FESEM) images. Upon illumination, the SKPM image shows an excess of photogenerated electrons present in the polymer phase. A correlation between morphology and surface photovoltage is presented.

• 2013-04-25

著者

• Mehta Bodh

  Thin Film Laboratory Department Of Physics Indian Institute Of Technology (iit)

• Mehta Bodh

  Thin Film Laboratory, Department of Physics, Indian Institute of Technology, New Delhi 110 016, India

• Rai Deepa

  Thin Film Laboratory, Department of Physics, Indian Institute of Technology, New Delhi 110 016, India

• Batra Yogita

  Thin Film Laboratory, Department of Physics, Indian Institute of Technology, New Delhi 110 016, India

関連論文

• Preparation of CdSe Quantum Dots via Thermolysis of a Novel Single Source Cd/Se Precursor Derived from Cyclohexeno-1,2,3-selenadiazole
• Synthesis of Cubic and Hexagonal CdTe Nanoparticles Dispersed in SiO2 Films: Role of Oxygen during Sintering
• Scanning Kelvin Probe Investigations of TiO

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