Variation in Absorber Layer Defect Density in Amorphous and Microcrystalline Silicon Thin Film Solar Cells with 2 MeV Electron Bombardment
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概要
- 論文の詳細を見る
The effect of the defect density in hydrogenated amorphous and microcrystalline silicon (a-Si:H and μc-Si:H) absorber layers on the performance of thin film solar cells was investigated. The defect density was varied reproducibly over more than two orders of magnitude by 2 MeV electron bombardment and subsequent thermal annealing. Considerable quantitative and qualitative differences were observed for the dependences of the cells parameters on the defect densities of a-Si:H and μc-Si:H. The experimental data suggest further possible improvement of μc-Si:H based solar cells with further reduced defect densities, while for a-Si:H based solar cells, a saturation of performance is observed below a defect density of about 10^{16} cm-3. Moreover, the experimental data provide an excellent database for numerical simulation over a range unavailable so far particularly in μc-Si:H based solar cells.
- 2012-02-25
著者
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Smirnov Vladimir
IEK-5 Photovoltaik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
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Astakhov Oleksandr
IEK-5 Photovoltaik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
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Carius Reinhard
IEK-5 Photovoltaik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
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Petrusenko Yuri
National Science Center, Kharkov Institute of Physics and Technology, 61108 Kharkov, Ukraine
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Borysenko Valeriy
National Science Center, Kharkov Institute of Physics and Technology, 61108 Kharkov, Ukraine
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Finger Friedhelm
IEK-5 Photovoltaik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
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Astakhov Oleksandr
IEK-5 Photovoltaik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
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Finger Friedhelm
IEK-5 Photovoltaik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
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Carius Reinhard
IEK-5 Photovoltaik, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
関連論文
- Silicon Thin Film Powder Samples for Electron Spin Resonance Investigation: Role of Substrate and Preparation Procedure
- Variation in Absorber Layer Defect Density in Amorphous and Microcrystalline Silicon Thin Film Solar Cells with 2 MeV Electron Bombardment