Topographic Contrast in Force Modulation Atomic Force Microscopy Images
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概要
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Topographic influences on force modulation microscopy (FMM) amplitude image contrasts have been investigated. Experimental results and a simple model analysis demonstrate that the amplitude has a close relevance to the x-derivative of sample topography. When the tip sample is in a single-point contact and the mechanical properties of the sample are homogeneous, the contrasts of the amplitude and x-derivative topography are almost the same. In addition, the amplitude contrast is reversed when the scan direction is opposite. When the tip sample is in a multipoint contact, the amplitude at the multipoint contact region increases markedly and the scan-direction relevant contrast reversion is still distinguishable. These results can help in the interpretation of FMM data accurately.
- 2012-05-25
著者
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Huang Wenhao
Department Of Precision Machinery And Instrumentation University Of Science And Technology Of China
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Chen Yuhang
Department Of Precision Machinery And Precision Instrumentation University Of Science And Technology
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Zheng Cheng
Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei 230026, P. R. China
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Huang Wenhao
Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei 230026, P. R. China
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Yang Chunlai
Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei 230026, P. R. China
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- Topographic Contrast in Force Modulation Atomic Force Microscopy Images