Precision Test Fixture for Measuring Equivalent Circuit Parameters of GHz Surface-Mounted Quarts Crystal Units

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概要

• 論文の詳細を見る

• We developed a coaxial-type fixture for precisely measurement of the impedance characteristics of small surface-mounted quartz crystal units. This fixture is applicable to the one-port S-parameter reflection method proposed in IEC60444-5, and measures the frequency impedance characteristics of a device under test (DUT) from its reflection coefficients. This measurement fixture uses a 65 GHz coaxial connector and calibrators with a 1.85 mm inside diameter. Using a ``zero-length'' coaxial center pin method, this fixture can be applied to up to 2 GHz devices without the need for electrical length compensation.

• 2012-07-25

著者

• Watanabe Yasuaki

  Tokyo Metropolitan University

• Wada Manabu

  Nihon Dempa Kogyo, Sayama, Saitama 350-1321, Japan

• Sakuta Yukinori

  Nihon University, Funabashi, Chiba 274-8501, Japan

• Hattori Masashi

  Seiko Epson, Suwa, Nagano 392-8502, Japan

• Takahashi Osamu

  Showa Shinku, Sagamihara 229-1124, Japan

関連論文

• P1-14 Influence of Viscosity Loss on 3-D Vibrations of VHF Rectangular AT-cut Quartz Plates(Poster session 1)
• Precision Test Fixture for Measuring Equivalent Circuit Parameters of GHz Surface-Mounted Quarts Crystal Units

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