Direct Observation of Local Shielding Currents in Superconducting Thin Films under Low Magnetic Field by Scanning Superconducting Quantum Interference Device Microscopy
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概要
- 論文の詳細を見る
We have observed local shielding current flows in oxide superconducting thin films under low magnetic field by scanning probe microscopy using a superconducting quantum interference device (SQUID). The strength and direction of current flow were characterized simultaneously and directly by observing magnetic signals around artificial holes. This method allows us to map the current flow without reverse Fourier transform. In this paper, experimental data and analyses of the current flows in oxide superconducting thin films up to 50 μT are shown. Furthermore, results of calculation based on a very simple model are also presented. The possibility of using scanning SQUID microscopy to characterize current flow is presented.
- 2012-09-25
著者
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Mochiduki Kazuya
Environment and Energy Materials Division, National Institute for Materials Science, Tsukuba, Ibaraki 305-0047, Japan
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Iguchi Ienari
Environment and Energy Materials Division, National Institute for Materials Science, Tsukuba, Ibaraki 305-0047, Japan
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Yun Kyungsung
Environment and Energy Materials Division, National Institute for Materials Science, Tsukuba, Ibaraki 305-0047, Japan
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Endo Kazuhiro
Research Laboratory for Integrated Technological Systems, Kanazawa Institute of Technology, Hakusan, Ishikawa 924-0838, Japan
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Hatano Takeshi
Environment and Energy Materials Division, National Institute for Materials Science, Tsukuba, Ibaraki 305-0047, Japan
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Arisawa Shunichi
Environment and Energy Materials Division, National Institute for Materials Science, Tsukuba, Ibaraki 305-0047, Japan