Observation of Tunneling Current in Semiconducting Graphene p--n Junctions
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概要
- 論文の詳細を見る
We demonstrate a tunneling and rectification behavior in bilayer graphene. A stepped dielectric top gate creates a spatially modulated electric field, which opens the band gap in the graphene and produces an insulating region at the p--n interface. A current--voltage relationship exhibiting differential resistance peak at forward bias stems from the tunneling current through the insulating region at the p--n interface. The tunneling current reflects singularities in the density of states modified by the electric field. This work suggests that the effect of carrier charge tuning by external electric field in 2D semiconductors is analogously to that by impurity doping in 3D semiconductors.
- 2012-01-15
著者
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Kanda Akinobu
Crest Japan Science And Technology Agency
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Hiura Hidefumi
MANA, National Institute for Materials Science, Tsukuba, Ibaraki 305-0047, Japan
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Li Song-Lin
MANA, National Institute for Materials Science, Tsukuba, Ibaraki 305-0047, Japan
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MIYAZAKI Hisao
MANA, National Institute for Materials Science, Tsukuba, Ibaraki 305-0047, Japan
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LEE Michael
MANA, National Institute for Materials Science, Tsukuba, Ibaraki 305-0047, Japan
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Tsukagoshi Kazuhito
MANA, National Institute for Materials Science, Tsukuba, Ibaraki 305-0047, Japan
関連論文
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- Observation of Tunneling Current in Semiconducting Graphene p--n Junctions