Determination of Trap Density Function Based on Measurements of Photoinduced Charge Carrier Extraction Using Linearly Increasing Voltage at Low Temperatures
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概要
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Experiments on photoinduced charge carrier extraction using linearly increasing voltage (photo-CELIV) are reported for an organic thin-film device having an active layer of poly(3-hexylthiophene) (P3HT) and [6,6]-phenyl-C61-butyric acid methyl ester (PCBM) below 90 K down to 1.6 K. CELIV peaks for different rates of voltage increase appear at almost the same electric fields at a temperature below 30 K. From this result, it is concluded that the CELIV signal does not reflect mobility at low temperatures. An analytical model that relates low-temperature CELIV signals to the trap density function is proposed.
- 2011-06-15
著者
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Tajima Hiroyuki
Institute For Solid State Physics The University Of Tokyo
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Tajima Hiroyuki
Institute for Solid State Physics, The University of Tokyo, Kashiwa, Chiba 277-8581, Japan
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Yasui Motoharu
Institute for Solid State Physics, The University of Tokyo, Kashiwa, Chiba 277-8581, Japan
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