High Reliability of High-Speed Vertical-Cavity Surface-Emitting Lasers with Silicone-Encapsulated Structure and Parallel Optical Transmitter Modules

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概要

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• Reliability of both high-speed vertical-cavity surface-emitting lasers (VCSELs) with silicone-encapsulated structure and the parallel optical transmitter modules were investigated. Results of wear-out life tests indicated that the VCSEL with a silicone-encapsulated structure has the same lifetime as a bare-chip VCSEL, which was more than $10^{6}$ h at the junction temperature of 90 °C. High reliability of the 20 Gbps $\times$ 12 channel on-board parallel optical transmitter modules in various test environments was also confirmed.

• 2011-02-25

著者

• Anan Takayoshi

  Nano Electronics Research Laboratories, NEC Corporation, Otsu 520-0833, Japan

• Yashiki Kenichiro

  NEC Corporation, Kawasaki 211-8666, Japan

• Hatakeyama Hiroshi

  Nano Electronics Research Laboratories, NEC Corporation, Otsu 520-0833, Japan

• Akagawa Takeshi

  NEC Corporation, Kawasaki 211-8666, Japan

• Fukatsu Kimiyoshi

  Nano Electronics Research Laboratories, NEC Corporation, Otsu 520-0833, Japan

• Tokutome Keiichi

  Nano Electronics Research Laboratories, NEC Corporation, Otsu 520-0833, Japan

• Tsuji Masayoshi

  Nano Electronics Research Laboratories, NEC Corporation, Otsu 520-0833, Japan

関連論文

• High Reliability of High-Speed Vertical-Cavity Surface-Emitting Lasers with Silicone-Encapsulated Structure and Parallel Optical Transmitter Modules

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