Anisotropic Transformation of 4H-SiC Etching Shapes by High-Temperature Annealing and Its Enhancement by Ion Implantation
スポンサーリンク
概要
- 論文の詳細を見る
The transformation of 4H-SiC etching shapes by high-temperature annealing was investigated. Although the opening of the etching mask was circular, the resulting etched shape was a hexagon, dodecagon, or rounded polygon with more edges, depending on the diameter. A hexagon was transformed into a dodecagon following high-temperature annealing, and a dodecagon was transformed into a rounded polygon.
- 2010-04-25
著者
-
Takeshi Tawara
Advanced Technology Laboratory, Fuji Electric Holdings Co., Ltd., Hino, Tokyo 191-8502, Japan
-
Kawada Yasuyuki
Advanced Technology Laboratory, Fuji Electric Holdings Co., Ltd., Hino, Tokyo 191-8502, Japan
-
Tawara Takeshi
Advanced Technology Laboratory, Fuji Electric Holdings Co., Ltd., Hino, Tokyo 191-8502, Japan
-
Nakamura Shun-ichi
Advanced Technology Laboratory, Fuji Electric Holdings Co., Ltd., Hino, Tokyo 191-8502, Japan
-
Takashi Tsuji
Advanced Technology Laboratory, Fuji Electric Holdings Co., Ltd., Hino, Tokyo 191-8502, Japan
-
Masahide Gotoh
Advanced Technology Laboratory, Fuji Electric Holdings Co., Ltd., Hino, Tokyo 191-8502, Japan
-
Noriyuki Iwamuro
Advanced Technology Laboratory, Fuji Electric Holdings Co., Ltd., Hino, Tokyo 191-8502, Japan
-
Shun-ichi Nakamura
Advanced Technology Laboratory, Fuji Electric Holdings Co., Ltd., Hino, Tokyo 191-8502, Japan
-
Yasuyuki Kawada
Advanced Technology Laboratory, Fuji Electric Holdings Co., Ltd., Hino, Tokyo 191-8502, Japan