Double Self Quotient Image Based Image Flattening for Defect Detection in Thin Film Transistor Liquid Crystal Display Panel

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概要

• 論文の詳細を見る

• This paper presents the results of using self quotient image (SQI) to flatten the background region of a thin film transistor liquid crystal display image. To overcome an inherent shortcoming of SQI method, namely the halo effect in thin film transistor liquid crystal display images, double SQI method is introduced. Experimental results demonstrate that SQI can be used effectively to eliminate a non-uniformity of the background region in a test image.

• 2010-03-25

著者

• Young-Chul Song

  School of Electrical Engineering and Computer Science, Kyungpook National University, Daegu 702-701, Korea

• Kil-Houm Park

  School of Electrical Engineering and Computer Science, Kyungpook National University, 1370 Sankyuk-dong, Puk-gu, Daegu 702-701, Korea

• Se-Yun Kim

  School of Electrical Engineering and Computer Science, Kyungpook National University, 1370 Sankyuk-dong, Puk-gu, Daegu 702-701, Korea

関連論文

• Intensity Flow Estimation of Thin Film Transistor Liquid Crystal Display Panel Surface Image Using Multiweighted Morphology Pairs
• Double Self Quotient Image Based Image Flattening for Defect Detection in Thin Film Transistor Liquid Crystal Display Panel

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