Fabrication of Short-Channel Thin-Film Transistor Using Conventional Photolithography
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概要
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Hydrogenated amorphous silicon thin-film transistors (TFTs) with channel length below 4 μm, were successfully fabricated using a new half-tone exposure technique combined with conventional photolithography. A concept of asymmetric double-slit design was applied to decrease channel length ($L$). TFTs having a channel length down to 3 μm was successfully fabricated, and showed better output capability with minor changes in mobility and off-state current.
- 2009-03-25
著者
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Yu Sang-Jeon
LG Display, Process Development Team 1, 1007 Deogeun-ri, Wollong-myeon, Paju, Gyeonggi-do, 413-811, Korea
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Jung Deuk-Soo
LG Display, Process Development Team 1, 1007 Deogeun-ri, Wollong-myeon, Paju, Gyeonggi-do, 413-811, Korea
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Park Mungi
LG Display, Process Development Team 1, 1007 Deogeun-ri, Wollong-myeon, Paju, Gyeonggi-do, 413-811, Korea
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Cheon Ki-Cheol
LG Display, Process Development Team 1, 1007 Deogeun-ri, Wollong-myeon, Paju, Gyeonggi-do, 413-811, Korea
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Woo Juhyun
LG Display, Process Development Team 1, 1007 Deogeun-ri, Wollong-myeon, Paju, Gyeonggi-do, 413-811, Korea
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Kim Hwan
LG Display, Process Development Team 1, 1007 Deogeun-ri, Wollong-myeon, Paju, Gyeonggi-do, 413-811, Korea
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Lim Byoung-Ho
LG Display, Process Development Team 1, 1007 Deogeun-ri, Wollong-myeon, Paju, Gyeonggi-do, 413-811, Korea