Measurement of Optical Constants for Molten Phase-Change Thin Film

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概要

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• The measurement of optical constants for molten phase-change thin film is a key issue in designing super-resolution media. We have succeeded in the stable measurement for the first time. In our measurements, phase-change thin film was sandwiched between metal oxide protective thin films, which remain stable over the melting point of phase-change material. The stability of this measurement was confirmed by the repeatability of the temperature dependence of transmittance and reflectance, and transmission electron microscopy (TEM) observation.

• 2008-07-25

著者

• Ohkubo Shuichi

  System Jisso Research Laboratories, NEC Corporation, 1753 Shimonumabe, Nakahara-ku, Kawasaki 211-8666, Japan

• Ohkubo Shuichi

  System Jisso Research Laboratories, NEC Corporation, Kawasaki 211-8666, Japan

• Eto Daisuke

  System Jisso Research Laboratories, NEC Corporation, Kawasaki 211-8666, Japan

• Aoki Kazuhiko

  System Jisso Research Laboratories, NEC Corporation, Kawasaki 211-8666, Japan

関連論文

• New Adaptive Partial Response Maximum Likelihood Detection for High-Density Optical Recording
• Measurement of Optical Constants for Molten Phase-Change Thin Film

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