Effects of Film Orientation on Ferroelectric and Piezoelectric Properties of Lanthanoid-Substituted Bi4Ti3O12 Thin Films
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概要
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The effects of film orientation on the ferroelectric and piezoelectric properties of (Bi3.25Ln0.75)Ti3O12 ($\text{Ln}=\text{La}$, Nd, and Sm) films were investigated. The films were grown on (111)Pt/TiO2/SiO2/Si and (100)IrO2/TiO2/Si by pulsed laser deposition. The films grown on (111)Pt electrodes showed (001)/(117) mixed orientation. Nondoped films exhibited a highly preferred $c$-axis orientation. In contrast, a strong 117 peak was observed in the X-ray diffraction (XRD) patterns of (Bi3.25Sm0.75)Ti3O12 films. The (117) orientation became dominant with decreasing radius of substituent ions. The films grown on (100)IrO2 electrodes showed predominantly (111) and (110) orientation. The piezoelectric coefficient $d_{\text{33f}}$ and remanent polarization $P_{\text{r}}$ were larger in (111)- and (110)-oriented films than in (001)- and (117)-oriented films.
- 2007-02-15
著者
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Setter Nava
Ceramics Laboratory Epfl Swiss Federal Institute Of Technology
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Muralt Paul
Ceramics Laboratory Swiss Federal Institute Of Technology Epfl
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Adachi Yutaka
Opto-electronic Group Optronic Materials Center National Institute For Materials Science
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Muralt Paul
Ceramics Laboratory, Swiss Federal Institute of Technology EPFL, CH-11015 Lausanne, Switzerland
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Setter Nava
Ceramics Laboratory, Swiss Federal Institute of Technology EPFL, CH-11015 Lausanne, Switzerland
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