Nanometer-Scale Depth Resolution and Sensitive Surface Analysis Using Laser Ablation Atomic Fluorescence Spectroscopy
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概要
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An extremely high-resolution, nanometer-resolution, solid-surface trace element detection has been demonstrated. Nanometer-thinned pulsed laser ablation was combined with extremely sensitive laser-induced fluorescence spectroscopy, and depth resolution of 3.6 nm was experimentally demonstrated for the first time on sodium detection in polymeric samples. An extremely high absolute detection limit of 25.2 fg was also obtained, and a theoretical calculation program was also generated to analyze the results.
- 2006-06-15
著者
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Takao Takayuki
Department Of Electronics Graduate School Of Information Science And Electrical Engineering Kyushu U
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HIGOTANI Takashi
Department of Electronic Device Engineering, Graduate School of Information Science and Electrical E
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MAEDA Mitsuo
Kurume National College of Technology
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Oki Yuji
Department Of Agricultural Chemistry University Of Osaka Prefecture
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Nakamura Daisuke
Department Of Division Of Hematology And Immunology Kagoshima University Graduate School Of Medical
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Higotani Takashi
Department of Electronic Device Engineering, Graduate School of Information Science and Electrical Engineering, Kyushu University, 6-10-1 Hakozaki, Higashi-ku, Fukuoka 812-8581, Japan
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Takao Takayuki
Department of Electronic Device Engineering, Graduate School of Information Science and Electrical Engineering, Kyushu University, 6-10-1 Hakozaki, Higashi-ku, Fukuoka 812-8581, Japan
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Nakamura Daisuke
Department of Cardiology, Osaka Rosai Hospital
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Nakamura Daisuke
Department of Electronic Device Engineering, Graduate School of Information Science and Electrical Engineering, Kyushu University, 6-10-1 Hakozaki, Higashi-ku, Fukuoka 812-8581, Japan
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