Resolving Nano Scale Recording Bits on Phase-Change Rewritable Optical Disk
スポンサーリンク
概要
- 論文の詳細を見る
We use a new imaging method to resolve the nano scale recording bits on phase-change rewritable optical disks. By this method, several kinds of nano scale recording bits on different phase-change optical disks can be clearly imaged without any painstaking or expensive procedures. With the conductive-atomic force microscopy (C-AFM) images of nano scale recording bits on phase-change materials, we can study the properties of phase-change recording layers and the recording bit formation mechanism comprehensively.
- 2006-02-15
著者
-
Tsai Din
Center Of Nanostorage Research National Taiwan University
-
Hsu Hao
Center for Nanostorage Research, National Taiwan University, Taipei 106, Taiwan
-
Hsu Hao
Center of Nanostorage Research, National Taiwan University, Taipei 10617, Taiwan
-
Lin Shih
Center of Nanostorage Research, National Taiwan University, Taipei 10617, Taiwan
-
Yang Peilin
Center of Nanostorage Research, National Taiwan University, Taipei 10617, Taiwan
-
Lin I
Center of Nanostorage Research, National Taiwan University, Taipei 10617, Taiwan
-
Tsai Din
Center of Nanostorage Research, National Taiwan University, Taipei 10617, Taiwan
関連論文
- Nonlinear Optical Properties of the Au-SiO_2 Nanocomposite Superresolution Near-field Thin Film
- Calculation of Surface Plasmon Effect on Optical Discs
- Resolving Nano Scale Recording Bits on Phase-Change Rewritable Optical Disk
- Nonlinear Optical Properties of the Au-SiO2 Nanocomposite Superresolution Near-field Thin Film
- Metallic Nanorods Doped Optical Recording Media: The Use of Nanorods As Nano-Heat Sensitizers
- Calculation of Surface Plasmon Effect on Optical Discs