Temperature Coefficients of Refractive Indices of TiO2–SiO2 Films
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概要
- 論文の詳細を見る
We investigated the temperature coefficients of the refractive indices of TiO2–SiO2 films with different TiO2 concentrations at varying annealing temperature. We found that the temperature coefficients change from positive to negative in such films with a TiO2 concentration of more than 50 mol% in such a high-temperature annealing. We obtained a negative temperature coefficient of $-4.7\times 10^{-5}$ 1/°C for film with a TiO2 concentration of 74 mol%.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2005-02-15
著者
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OGUMA Manabu
NTT Photonics Laboratories
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ITOH Mikitaka
NTT Photonics Laboratories
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Hirota Hidenobu
Ntt Photonics Laboratories
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Hibino Yoshinori
Ntt Photonics Laboratories
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Hibino Yoshinori
NTT Photonics Laboratories, 3-1 Moronosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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Oguma Manabu
NTT Photonics Laboratories, 3-1 Moronosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan
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