Estimating the Optical Thickness Errors in Vertical-Cavity Surface-Emitting Laser Structures from Optical Reflection Spectra

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概要

• 論文の詳細を見る

• Effects of the systematic epi-layer thickness errors on the optical reflection spectra have been studied in epitaxial wafers for 850 nm vertical-cavity surface-emitting lasers (VCSELs), and a procedure of estimating the error layer and magnitude is proposed. The experimentally confirmed procedure is based on the finding that the overall shape of the reflection spectra depends mainly on a newly defined parameter, the effective error.

• INSTITUTE OF PURE AND APPLIED PHYSICSの論文
• 2004-01-15

著者

• KIM Sung-Han

  PROWTech Inc.

• SON Jeong-Hwan

  PROWTech Inc.

• KIM Bum-Joon

  PROWTech Inc.

• KIM Bong-Cheol

  PROWTech Inc.

• Kim Nam-gil

  School Of Electronics Engineering Ajou University

• Kim Sang-bae

  School Of Electronics Engineering Ajou University

• Kim Bong-Cheol

  PROWTech Inc., 621-2, Janggwan-ri, Jinchun-eup, Chungbuk 365-800, Korea

• Kim Sang-Bae

  School of Electronics Engineering, Ajou University, 5, Wonchon-dong, Suwon 442-749, Korea

• Son Jeong-Hwan

  PROWTech Inc., 621-2, Janggwan-ri, Jinchun-eup, Chungbuk 365-800, Korea

• Kim Bum-Joon

  PROWTech Inc., 621-2, Janggwan-ri, Jinchun-eup, Chungbuk 365-800, Korea

• Kim Nam-Gil

  School of Electronics Engineering, Ajou University, 5, Wonchon-dong, Suwon 442-749, Korea

• Kim Sung-Han

  PROWTech Inc., 621-2, Janggwan-ri, Jinchun-eup, Chungbuk 365-800, Korea

関連論文

• Estimating the Optical Thickness Errors in Vertical-Cavity Surface-Emitting Laser Structures from Optical Reflection Spectra
• Estimating the Optical Thickness Errors in Vertical-Cavity Surface-Emitting Laser Structures from Optical Reflection Spectra

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