Improvement in Image Reconstruction of Scanning Near-Field Millimeter-Wave Microscopy Using a Metal Slit-Type Probe
スポンサーリンク
概要
- 論文の詳細を見る
Improvements in image reconstruction of scanning near-field millimeter-wave microscopy using a metal slit-type probe have been demonstrated. A conjugate gradient method in combination with preconditioning and regularization has been used during the image reconstruction process to take into account the sensitivity distribution of the slit-type probe. The reconstructed images show that the image degradation that occurs due to the sensitivity distribution can be corrected.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2001-06-15
著者
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Mizuno Koji
Research Institute Of Electrical Communication Tohoku University
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NOZOKIDO Tatsuo
Photodynamics Research Center, The Institute of Physical and Chemical Research (RIKEN)
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Bae Jongsuck
Research Institute Of Electrical Communication Tohoku University
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Kudo Hiroyuki
Institute Of Biomaterials And Bioengineering Tokyo Medical And Dental University
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Bae Jongsuck
Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
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Nozokido Tatsuo
Photodynamics Research Center, The Institute of Physical and Chemical Research (RIKEN), 19-1399 Aza-Koeji, Naga-Machi, Aoba-ku, Sendai 980-0868, Japan
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Mizuno Koji
Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
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