Frequency Scan Spectra of Surface Plasmons Excitation in an Arbitrary Multilayer System

概要

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In this paper, we have derived approximate formulas from the Fresnel formulas and pole expansion for the reflectivity and resonant frequency in an arbitrary multilayer system. In accordance with the results of simulation, we conclude that the resonant wavelength increases when the incidence angle decreases and the resonant frequency increases when the metal thickness increases. Moreover the sensitivity of the resonant frequency versus the metal thickness is very large when the metal thickness is modulated from 10 nm to 60 nm. One can make use of these properties to fabricate the instrument of the metal film measurement. Besides, the resonant frequency is a function of the environment dielectric constant. One can apply the property to the chemical sensor based on surface plasmons (SPs) measurement.
Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
2001-06-15