Experimental Results of Space Layer Thickness for Blue-Wavelength Dual-Layered Disc
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概要
- 論文の詳細を見る
To determine the effects of spherical aberration due to defocus and interference of layer 0(L0) and layer 1(L1) in high-density dual layered-discs, 17 sets of discs structures are measured while maintaining thickness uniformity of the space layer within $\pm 1.5$ $\mu$m for one revolution. After measuring the discs, an optimum thickness of 30 $\mu$m of the space layer is obtained.
- 2001-03-30
著者
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Park Chang-min
Dms Laboratory Corporate R&d Center Samsung Electronics Co. Ltd.
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Kim Yoon-gi
Dms Laboratory Corporate R&d Center Samsung Electronics Co. Ltd.
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YOON Du-Seop
DMS Laboratory, Corporate R&D Center, Samsung Electronics Co., Ltd.
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RO Myung-Do
DMS Laboratory, Corporate R&D Center, Samsung Electronics Co., Ltd.
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PARK In-Sik
DMS Laboratory, Corporate R&D Center, Samsung Electronics Co., Ltd.
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SHIN Dong-Ho
DMS Laboratory, Corporate R&D Center, Samsung Electronics Co., Ltd.
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Lee Kyung-Geun
DMS Laboratory, Corporate R&D Center, Samsung Electronics Co., Ltd., 416 Maetan-3ding, Paldal-gu, Suwon City, Kyungki-Do 442-742, Korea
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Park Chang-Min
DMS Laboratory, Corporate R&D Center, Samsung Electronics Co., Ltd., 416 Maetan-3ding, Paldal-gu, Suwon City, Kyungki-Do 442-742, Korea
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Yoon Du-Seop
DMS Laboratory, Corporate R&D Center, Samsung Electronics Co., Ltd., 416 Maetan-3ding, Paldal-gu, Suwon City, Kyungki-Do 442-742, Korea
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Ro Myung-Do
DMS Laboratory, Corporate R&D Center, Samsung Electronics Co., Ltd., 416 Maetan-3ding, Paldal-gu, Suwon City, Kyungki-Do 442-742, Korea
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Park In-Sik
DMS Laboratory, Corporate R&D Center, Samsung Electronics Co., Ltd., 416 Maetan-3ding, Paldal-gu, Suwon City, Kyungki-Do 442-742, Korea
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Shin Dong-Ho
DMS Laboratory, Corporate R&D Center, Samsung Electronics Co., Ltd., 416 Maetan-3ding, Paldal-gu, Suwon City, Kyungki-Do 442-742, Korea
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Kim Yoon-Gi
DMS Laboratory, Corporate R&D Center, Samsung Electronics Co., Ltd., 416 Maetan-3ding, Paldal-gu, Suwon City, Kyungki-Do 442-742, Korea
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