Measurement of Complex Dielectric Constant above Room Temperature and Its Application to Determination of Intrinsic Dielectric Loss

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概要

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• Measurements of the complex permittivity on single crystal dielectric materials with different crystal symmetry have been carried out at high temperatures. The theory of intrinsic dielectric loss proposed by Gurevich et al.. was confirmed for Oh7 and D3d6 symmetries. X-ray topography images showed that crystal disorientation caused a deleterious influence on dielectric loss.

• Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
• 1998-09-30

著者

• Miura Taro

  Tdk Advanced Device Development Center

• Ikeda Masaaki

  TDK Electronic Device Business Group, Tachisawa, Hirasawa, Nikaho, Akita 018-0402, Japan

• Miura Taro

  TDK Advanced Device Development Center, Higashi-Ohwada, Ichikawa, Chiba 272-8558, Japan

関連論文

• Measurement of Complex Dielectric Constant above Room Temperature and Its Application to Determination of Intrinsic Dielectric Loss

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