Relation between Molecular Orientation and Rubbing Strength Observed by Reflection Ellipsometry
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概要
- 論文の詳細を見る
The relation between polyimide molecule orientation and rubbing strength (RS) is studied using reflection ellipsometry, and the film structure is considered to be different above and below an RS of 2.2 mm. Above 2.2 mm, the ordering of polyimide increases sharply in the weakly rubbed condition, and then saturates. The tilt angle of the principal dielectric axis of the molecule-oriented layer also increases very sharply to 53° and then monotonically decreases to 39°. However, no marked RS dependence is observed in the thickness of the molecule-oriented layer.
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 1997-08-15
著者
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Hirosawa Ichiro
Analysis And Evaluation Technology Center Nec Corporation
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Hirosawa Ichiro
Analysis and Evaluation Technology Center, NEC Corporation, 1753 Shimonumabe, Nakahara, Kawasaki 211, Japan
関連論文
- Method of Characterizing Rubbed Polyimide Film for Liquid Crystal Display Devices Using Reflection Ellipsometry
- Relation between Molecular Orientation and Rubbing Strength Observed by Reflection Ellipsometry