Achieving 63 pm Resolution in Scanning Transmission Electron Microscope with Spherical Aberration Corrector
スポンサーリンク
概要
- 論文の詳細を見る
The performance of a newly developed high-resolution 300 kV microscope equipped with a spherical aberration corrector for probe-forming systems is reported. This microscope gave the highest resolution for the distance between atomic columns, as determined by a high-angle annular dark field imaging method using a GaN[211] crystalline specimen, where the distance between the neighboring columns of Ga was 63 pm.
- 2007-06-25
著者
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YAMAMOTO Naoki
CREST, Japan Science and Technology Agency
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Sannomiya Takumi
CREST, Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan
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Tanishiro Yasumasa
CREST, Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan
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Sawada Hidetaka
CREST, Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan
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Hosokawa Fumio
CREST, Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan
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Kaneyama Toshikatsu
CREST, Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan
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Ishizawa Toshihiro
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan
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Terao Mitsuhisa
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan
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Kawazoe Muneyuki
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan
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Tomita Takeshi
CREST, Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan
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Kondo Yukihito
CREST, Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan
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Tanaka Takayuki
CREST, Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan
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Oshima Yoshifumi
CREST, Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan
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Takayanagi Kunio
CREST, Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan
関連論文
- Anomalous Enhancement of Light Emission by Au Adsorption on a Si(001) Vicinal Surface(Condensed Matter: Structure, Mechanical and Thermal Properties)
- Achieving 63 pm Resolution in Scanning Transmission Electron Microscope with Spherical Aberration Corrector