Mechanisms of Aging of Antimony Doped Tin Oxide Based Electrochromic Devices

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概要

• 論文の詳細を見る

• Electrochromic effects of antimony doped tin oxide (ATO) nanoparticles are investigated to probe device yellowing (degradation). Voltage vs contrast ratio curves exhibit hysteresis, i.e., image-sticking phenomena due to irreversible charge insertion. X-ray, impedance and optical b* studies suggest that the yellowing/charge trapping is nanoparticle size-dependent with 4 nm size particles exhibiting the least yellowing. Yellowing results in increased impedances of electrode–electrolyte interface and electrode corrosion. Plausible sources of discoloration are formation of insulating complex alkali oxide film, carrier inversion (n-to-p type) through electrochemical Li doping, redeposition of the corroded electrode material and perhaps residual concentration of charge-transfer species.

• 2006-12-25

著者

• Coleman James

  Albion Llc

• Chan Joo

  Department of Chemistry, Portland State University, Portland, Oregon 97207, U.S.A.

• Coleman James

  Albion LLC, Maryland Heights, Missouri 63043, U.S.A.

• Hannah Nicole

  Department of Chemistry, Portland State University, Portland, Oregon 97207, U.S.A.

• Rananavare Shankar

  Department of Chemistry, Portland State University, Portland, Oregon 97207, U.S.A.

• Yeager Laura

  Avery Research Center, Avery Dennison, Pasadena, California 91107, U.S.A.

• Dinescu Liviu

  Avery Research Center, Avery Dennison, Pasadena, California 91107, U.S.A.

• Saraswat Ashok

  Avery Research Center, Avery Dennison, Pasadena, California 91107, U.S.A.

• Iyer Pradeep

  Avery Research Center, Avery Dennison, Pasadena, California 91107, U.S.A.

関連論文

• Mechanisms of Aging of Antimony Doped Tin Oxide Based Electrochromic Devices

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