Vertical System Integration by Using Inter-Chip Vias and Solid-Liquid Interdiffusion Bonding
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概要
- 論文の詳細を見る
A new approach for 3D system integration, called Inter Chip Via-Solid Liquid Interdiffusion (ICV-SLID) is introduced. This is a new chip-to-wafer stacking technology which combines the advantages of the Inter Chip Via (ICV) process and the solid-liquid-interdiffusion technique (SLID) of copper and tin. The fully modular ICV-SLID concept allows the formation of multiple device stacks. A test chip was designed and the total process sequence of the ICV-SLID technology for the realization of a three-layer chip-to-wafer stack was demonstrated. The proposed wafer-level 3D integration concept has the potential for low cost fabrication of multi-layer high-performance 3D-SoCs and is well suited as a replacement for embedded technologies based on monolithic integration.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2004-07-01
著者
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Merkel Reinhard
Fraunhofer Institute For Reliability And Microintegration Munich Division
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Ramm Peter
Fraunhofer Institute For Reliability And Microintegration Munich Division
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Weber Josef
Fraunhofer Institute for Reliability and Microintegration, Munich Division, Hansastrasse 27d, 80686 Munich, Germany
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Klumpp Armin
Fraunhofer Institute for Reliability and Microintegration, Munich Division, Hansastrasse 27d, 80686 Munich, Germany
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Wieland Robert
Fraunhofer Institute for Reliability and Microintegration, Munich Division, Hansastrasse 27d, 80686 Munich, Germany
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Ramm Peter
Fraunhofer Institute for Reliability and Microintegration, Munich Division, Hansastrasse 27d, 80686 Munich, Germany
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Merkel Reinhard
Fraunhofer Institute for Reliability and Microintegration, Munich Division, Hansastrasse 27d, 80686 Munich, Germany
関連論文
- Analysis of Wafer Bonding by Infrared Transmission
- 3D System Integration : Enabling Technologies and Applications
- Vertical System Integration by Using Inter-Chip Vias and Solid-Liquid Interdiffusion Bonding