Computer Simulation on Spatial Resolution of Refraction X-ray Dark-Field Imaging by Dynamical Diffraction Theory for a Laue-case Crystal Analyzer
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概要
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X-ray optics for XDFI (X-ray Dark-Field Imaging) and BFI (Bright-field imaging) have been proposed and applied to visualize X-ray refraction effects yielded in biomedical objects1). In order to clarify the spatial resolution due to a crystal analyzer in Laue geometry, a program based on the Takagi-Taupin equation was modified to be used for carrying out simulations to evaluate the spatial resolution of images coming into a Laue angular analyzer (LAA). The calculation was done with a perfect plane wave for diffraction wave-fields, which corresponded to both DFI and BFI, under the conditions of 35 keV and a diffraction index 440 for 160 and 480 μm-thick LAAs, adding to refraction effects.
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一般社団法人 日本MRS | 論文
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