Spontaneous Polarization of Neodymium-Substituted Bi4Ti3O12 Estimated from Epitaxially Grown Thin Films with in-Plane c-Axis Orientations
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(100)/(010)- and (110)-oriented neodymium-substituted Bi<SUB>4</SUB>Ti<SUB>3</SUB>O<SUB>12</SUB> films were grown by metalorganic chemical vapor deposition on (101) and (001)RuO<SUB>2</SUB> layers with a rutile structure. Epitaxial growth of the films with an in-plane <I>c</I>-axis orientation was confirmed by several X-ray diffraction measurements. Large remanent polarizations of 31 and 34 μC/cm<SUP>2</SUP> were observed for the (100)/(010)- and (110)-oriented films, respectively. On the basis of the volume fractions of (100)- and (010)-oriented crystal estimated for the (100)/(010)-oriented film by X-ray diffraction, the spontaneous polarization of neodymium-substituted Bi<SUB>4</SUB>Ti<SUB>3</SUB>O<SUB>12</SUB> along the <I>a</I>-axis was estimated to be 58 μC/cm<SUP>2</SUP> from both kinds of epitaxial films.
- 公益社団法人 応用物理学会の論文
公益社団法人 応用物理学会 | 論文
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