The Importance of the Collision of Impinging Atoms to Predeposited Atoms in Thin-Film Growth on a Cryogenic Substrate.
スポンサーリンク
概要
- 論文の詳細を見る
Field-ion microscope observation of Mo deposition on a W tip at cryogenic temperature revealed that each Mo atoms, once adsorbed on a tip, was sometimes displaced to a certain distance, due to the collision of impinging atoms. This collision occasionally brought about the rearrangement of atoms in a cluster. The rearrangement of atoms induced by the collision is considered to play a very important role, particularly in epitaxial growth on a cryogenic substrate.
- 公益社団法人 応用物理学会の論文
公益社団法人 応用物理学会 | 論文
- Electron Channelling Effect in an Al–Fe–Cu Quasicrystal
- Construction and Performance of a Large-Aperture Wire-Chamber Spectrometer for Pion Scattering Experiments at KEK
- Effect of Plasma Injection on Cold Wall Type MHD Generator
- Development of Scanning μ-RHEED Microscopy for Imaging Polycrystal Grain Structure in LSI
- Boundary Layer Cooling Effect on Semi-Hot Wall Type MHD Channel