Structural Analysis of Langmuir-Blodgett Films of Alkylated Tetracyanoquinodimethanes.
スポンサーリンク
概要
- 論文の詳細を見る
Structural characterization of alkylated tetracyanoquinodimethane (TCNQ) Langmuir and Langmuir-Blodgett (LB) films has been carried out. Scanning electron microscope (SEM) and atomic force microscope (AFM) observations reveal numerous platelet microcrystal domains in the alkylated TCNQ Langmuir films transferred onto a quartz substrate. The analysis of height distribution in the AFM data proves that these domains have periodic layered structure. The thickness of these layered structures agrees well with the d-values obtained by X-ray diffraction analysis of the alkylated TCNQ LB films. Moreover, the high-resolution AFM image and the d-value of the 2-dodecyl-TCNQ Langmuir film suggest that the structure of the second and the upper layers in the domains is identical to that of the single crystal. SEM and AFM measurements prove that the LB films consist of numerous platelet microcrystal domains which are superposed upon each other, resembling a mosaic structure. Therefore, the periodic structures observed in X-ray diffraction measurements of the alkylated TCNQ LB films are ascribed to the layered structure in these domains, although they are usually explained as well-defined multilayered structure.
- 公益社団法人 応用物理学会の論文
公益社団法人 応用物理学会 | 論文
- Electron Channelling Effect in an Al–Fe–Cu Quasicrystal
- Construction and Performance of a Large-Aperture Wire-Chamber Spectrometer for Pion Scattering Experiments at KEK
- Effect of Plasma Injection on Cold Wall Type MHD Generator
- Development of Scanning μ-RHEED Microscopy for Imaging Polycrystal Grain Structure in LSI
- Boundary Layer Cooling Effect on Semi-Hot Wall Type MHD Channel