Grain Contrast Imaging in UHV SLEEM
スポンサーリンク
概要
- 論文の詳細を見る
Study of the grain structure in the equal channel angular pressing processed copper by means of the cathode lens equipped ultrahigh vacuum scanning low energy electron microscope is reported. The grain contrast was found achieving its maximum at electron energies below about 30 eV where it alternated its sign and exhibited dependence on electron energy specific for the grain orientation. The energy dependence of the electron reflectance seemed to be capable of serving as a fingerprint enabling determination of the crystalline orientation. In the cathode lens mode at hundreds of eV fine details of the microstructure are also observable including twins and low angle grain boundaries. This is explained by acquisition of high-angle backscattered slow electrons, normally not acquired in standard scanning electron microscopes. The very low energy electron reflectance is promising as an alternative to the EBSD method owing to its high resolution and fast data acquisition.
- The Japan Institute of Metals and Materialsの論文
The Japan Institute of Metals and Materials | 論文
- Control of Ferromagnetism in Magnetic Semiconductors and Application for Spin-polarized Electron Source
- 超高純度金属の実用化への道
- 非極性 GaN 層中の微結晶粒の効率的な検出と今後の展望
- Recycling Technology for Platinum Group Metals by Using Perovskite-type Oxides
- Specimen Preparation Methods with FIB for In-Situ TEM Observations in Materials Science—TEM Specimen Preparation by FIB with Glass Manipulator—