A Product Testing Method on a Parallel and Distributed System

概要

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This paper deals with a product testing method on a parallel and distributed system that consists of several test data acquisition devices and several test data processing devices. The test data acquisition device depicts data in a constant period and the data are sent to the test data processing device. In this system, acquisition and transmission of the test data takes several tens of milliseconds, and test data processing requires about a hundred milliseconds. In this environment, every test data acquisition must be assigned to a data processing device without blocking the next acquisition, while balancing the load among processors. This paper describes and discusses a testing system and a load balancing method. This system and the suggested method were evaluated against actual testing problems. As a result, the processing time was reduced by 72% and the required amount of memory was reduced by 99.7%, compared to a sequential process in which a certain number of data processing devices are available. Moreover, processing time and required amount of memory were reduced by 19% and 98.8%, respectively, compared with a random load balancing method.
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