Applied AC Voltage for Detecting Open Leads of CMOS LSI by Monitoring Supply Current under AC Electric Field

概要

論文の詳細を見る
We have proposed a supply current test method for detecting open leads in CMOS ICs. The method is based on the supply current of a circuit made of CMOS ICs, which flows when an AC electric field is supplied from outside the ICs. The electric field is generated by providing AC voltage between electrodes which are placed over the targeted leads and under a targeted PCB. In this paper, we experimentally examine how large an amplitude of AC voltage should be provided between the electrodes to detect open leads in the CPLD LSIs of PLCC, QFP and TQFP packages. The results reveal that the amplitude of the AC voltage needed to enable open leads detection depends on the shape of the package and the logic threshold voltage of the targeted ICs and printed circuit boards used. Also, they show that in some LSIs the required amplitude depends on the output logic level to an open lead.
社団法人エレクトロニクス実装学会の論文