Measurement of Multi-photon Absorption and Electron Avalanche in UV Optical Thin Films.
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Non-linear absorption was measured for optical thin layers of various oxides and fluorides by using 1.7 ps and 20 ns pulses of a KrF laser. Laser induced damage due to two-photon absorp-tion was detected in oxide coatings by photo-acoustic measurement. In fluoride films, three photon absorption was less than linear absorption up to their damage threshold around 600GW/cm<SUP>2</SUP>. We measured photo-current in the films to detect dynamic absorption within nanosecond irradiation. A nonlinear current growth due to electron avalanche was observed. The damage thresholds were found to be correlated inversely with the carrier lifetime of coatings.
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社団法人 レーザー学会 | 論文
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