Active Learning for Software Defect Prediction

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概要

• 論文の詳細を見る

• An active learning method, called Two-stage Active learning algorithm (TAL), is developed for software defect prediction. Combining the clustering and support vector machine techniques, this method improves the performance of the predictor with less labeling effort. Experiments validate its effectiveness.

著者

• Luo Guangchun

  University Of Electronic Science And Technology Of China

• MA Ying

  University of electronic science and technology of China

• QIN Ke

  University of Electronic Science and Technology of China

関連論文

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• Active Learning for Software Defect Prediction

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