Cardiac Implantable Electronic Device Replacement Is Associated with Potential Complications: Complication Rates from a New Zealand Tertiary Centre

概要

論文の詳細を見る
Background: Device replacements are traditionally considered as low risk procedures; however, recent studies suggest complications are not uncommon. We report 6-month complication rates for patients undergoing device replacement procedure at our institution. Methods: Consecutive patients from September 2008 to August 2010 undergoing device replacement were reviewed and complications within 6 months recorded. Results: Of 106 patients (age 71 +/− 16 y), all had 6 month follow-up data. Procedure types were 75% pacemaker and 25% Implantable Cardioverter-Defibrillator, of which 30% were bi-ventricular devices. Ten (10%) of the procedures involved device upgrade or lead revision. Major complications occurred in 5 (5%): 1 death at post-op day 2, 2 infections requiring additional procedure, 1 wound dehiscence requiring revision and 1 pre-erosion requiring pocket revision. Minor complications (defined as managed as an outpatient) occurred in 8 (8%) patients: 1 haematoma lasting more than 7 days with tenderness, 1 haematoma without tenderness, 6 had superficial wound infection requiring oral antibiotics. Conclusion: Device replacement procedures are associated with notable complication rates. Most complications are relatively minor infections requiring oral antibiotic treatment; however, severe infections requiring further procedures occurred in 2% of the cohort.