Improvement of Detectable Limit of an Ion Probe Mass Spectrometer
スポンサーリンク
概要
- 論文の詳細を見る
An energy selector was attached to a double focusing ion probe mass spectrometer in order to improve the detectable limit for trace component analyses. The detectable limit of boron in silicon was about 100 times as low as that obtained without it and found to be about 40 ppb. By the use of the improved apparatus, the relative production rates of the multiply-charged ions were investigated for carbon and silicon. Under the normal instrumental conditions, the ratios of C<SUP>2</SUP>+/C+and Si<SUP>4</SUP>+/Si+were found to be3.6×10<SUP>-6</SUP> and 5.9×10<SUP>-7</SUP>, respectively.
- 日本質量分析学会の論文
著者
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Okano Jun
Institute Of Geological Sciences College Of General Education Osaka University
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Nishimura Hiroshi
Institute Of Geological Sciences College Of General Education Osaka University
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FUJIWARA TATEKI
Institute of Geological Sciences, College of General Education, Osaka University,
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NISHIMURA HIROSHI
Institute of Geological Sciences, College of General Education, Osaka University,
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OKANO JUN
Institute of Geological Sciences, College of General Education, Osaka University,
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