写真法GM法両用X線応力測定ゴニオメータについて

概要

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Previously we had introduced an X-ray stress measuring apparatus to be used in field service, specially designed to measure the stress of large unmovable samples or abnormally shaped samples. To follow this up we have completed its development in designing a goniometer to make it possible to test or examine its stress measurement. The goniometer is designed to make precise measurement taking the following errors into account. (1) The error of the sample positioning. (2) The mechanical errors of the goniometer itself. (3) The fluctuation of the X-ray output. (4) The statistical fluctuation of the GM counter and the data of the measurement by this apparatus have in proved its precision percentage. In this paper particular accounts are given of the X-ray goniometer for measurement of stress. The distinctive features of this apparatus are mentioned below: (1) The positioning of the sample is easy. (2) It has precise mechanism. (3) The parallel beam method is adopted. (4) It is applicable to simultaneous measurement both by the film method and by the GM counting method. (5) A slender X-ray tube extends the range of making effective scanning of angles. (6) This apparatus can be connected to the X-ray diffractometer. Some errors are estimated in the measurement of assumed conditions in this paper.
社団法人日本材料学会の論文