A novel method for real-time structural monitoring of molecular beam epitaxy(MBE) processes.
スポンサーリンク
概要
著者
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KATAYAMA Mitsuhiro
The Institute of Physical and Chemical Research
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AONO Masakazu
The Institute of Physical and Chemical Research
関連論文
- Force Microscopy Study of SrTiO_3(001) Surfaces with Single Atomic-Layer Steps
- Structure Analysis of the CaF_2/Si(111) Interface in Its Initial Stage of Formation by Coaxial Impact-Collision Ion Scattering Spectroscopy (CAICISS)
- Three Distinct Terraces on a β-(ET)_2I_3 Surface Studied by Scanning Tunneling Microscopy
- Electronic and Magnetic States in Ferromagnets Observed by a Spin-Polarized Scanning Tunneling Microscope
- Dynamic charge of Cs atoms on GaAs(110)
- Optical Parametric Amplification using the Phase Matching Retracing Behavior in MgO:LiNbO_3 for Generation of Intense Widely Tunable Mid-infrared Pulses
- Bond Length Relaxation in Ultrathin InAs and InP_As_ Layers on InP(001)
- Local Structure of CuInSe_2 Thin Film Studied by EXAFS
- Study of the Si(111)√×√-Sb Structure by X-Ray Diffraction
- Tip-induced Electron Occupation of an Unoccupied Surfae State in Scanning Tunneling Microscopy Imaging of a GaAs(110) Surface with Ag Clusters
- Sudden Suppression of Electron-Transmission Peaks in Finite-Biased Nanowires
- Magnetic-Field-Induced Second-Harmonic Generation on Si(111)-7×7 : Optical Properties of Condensed Matter
- Modification of RGA and Measurement of Partial Pressures in XHV Region
- Summary Abstract
- A novel method for real-time structural monitoring of molecular beam epitaxy(MBE) processes.